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Ageing of glass passivated TRIAC devices under thermal and electrical stress

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https://hal-univ-tours.archives-ouvertes.fr/hal-03192638
Contributor : Gael Gautier Connect in order to contact the contributor
Submitted on : Thursday, April 8, 2021 - 11:01:13 AM
Last modification on : Friday, January 14, 2022 - 5:10:03 PM

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Y. Buvat, E. Bouyssou, B. Morillon, Gaël Gautier. Ageing of glass passivated TRIAC devices under thermal and electrical stress. Microelectronics Reliability, Elsevier, 2020, 114, pp.113767. ⟨10.1016/j.microrel.2020.113767⟩. ⟨hal-03192638⟩

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