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Journal Articles Microelectronics Reliability Year : 2020

Ageing of glass passivated TRIAC devices under thermal and electrical stress

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hal-03192638 , version 1 (21-11-2022)

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Attribution - NonCommercial - CC BY 4.0

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Y. Buvat, E. Bouyssou, B. Morillon, Gaël Gautier. Ageing of glass passivated TRIAC devices under thermal and electrical stress. Microelectronics Reliability, 2020, 114, pp.113767. ⟨10.1016/j.microrel.2020.113767⟩. ⟨hal-03192638⟩
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