Metal-insulator transition in V 2 O 3 thin film caused by tip-induced strain

N. Alyabyeva 1 J. Sakai 1 M. Bavencoffe 1 J. Wolfman 1 P. Limelette 1 H. Funakubo 2 A. Ruyter 1
1 GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies)
2 TITECH - Tokyo Institute of Technology [Tokyo]
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Submitted on : Monday, February 11, 2019 - 5:46:36 PM
Last modification on : Tuesday, November 19, 2019 - 4:48:34 PM

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N. Alyabyeva, J. Sakai, M. Bavencoffe, J. Wolfman, P. Limelette, et al.. Metal-insulator transition in V 2 O 3 thin film caused by tip-induced strain. Applied Physics Letters, American Institute of Physics, 2018, 113 (24), pp.241603. ⟨10.1063/1.5063712⟩. ⟨hal-02014824⟩

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