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Journal articles
Metal-insulator transition in V 2 O 3 thin film caused by tip-induced strain
Natalia Alyabyeva
1
Joe Sakai
1
M. Bavencoffe
1
J. Wolfman
1
P. Limelette
1
H. Funakubo
2
A. Ruyter
1
Natalia Alyabyeva 1
Author
Joe Sakai 1
Author
M. Bavencoffe 1
Author IdHAL : m-bavencoffe ORCID : https://orcid.org/0000-0003-0700-3047
J. Wolfman 1
Author IdHAL : jerome-wolfman IdRef : https://www.idref.fr/184724678 ORCID : https://orcid.org/0000-0002-4786-2869
P. Limelette 1
Author IdHAL : patrice-limelette ORCID : https://orcid.org/0000-0003-4311-8589
H. Funakubo 2
Author
A. Ruyter 1
Author IdHAL : antoine-ruyter IdRef : https://www.idref.fr/133283674 ORCID : https://orcid.org/0000-0003-1798-8265
1
GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) (Bât. E, 20 avenue Monge, 37200 Tours - France)
- INSA CVL - Institut National des Sciences Appliquées - Centre Val de Loire (88 boulevard Lahitolle, CS 60013, 18022 Bourges cedex - France)
- Université de Tours (60 rue du Plat d'Étain, 37020 Tours cedex 1 - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7347 (France)
2
TITECH - Tokyo Institute of Technology [Tokyo] (2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550 - Japan)
Document type :
Journal articles
Complete list of metadata
https://hal-univ-tours.archives-ouvertes.fr/hal-02014824
Contributor : Jerome Wolfman Connect in order to contact the contributor
Submitted on : Monday, February 11, 2019 - 5:46:36 PM
Last modification on : Friday, April 10, 2020 - 2:52:02 PM
Contributor : Jerome Wolfman Connect in order to contact the contributor
Submitted on : Monday, February 11, 2019 - 5:46:36 PM
Last modification on : Friday, April 10, 2020 - 2:52:02 PM
Identifiers
- HAL Id : hal-02014824, version 1
- DOI : 10.1063/1.5063712
Collections
UNIV-TOURS | CNRS | GREMAN | INSA-GROUPE | INSA-CVL
Citation
Natalia Alyabyeva, Joe Sakai, M. Bavencoffe, J. Wolfman, P. Limelette, et al.. Metal-insulator transition in V 2 O 3 thin film caused by tip-induced strain. Applied Physics Letters, American Institute of Physics, 2018, 113 (24), pp.241603. ⟨10.1063/1.5063712⟩. ⟨hal-02014824⟩
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