Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

Nathanaël Grillon 1 Emilien Bouyssou 1 Sebastien Jacques 2 Gaël Gautier 2
1 ST-TOURS - STMicroelectronics [Tours]
2 GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies)
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Journal articles
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https://hal-univ-tours.archives-ouvertes.fr/hal-01997427
Contributor : Sebastien Jacques <>
Submitted on : Tuesday, January 29, 2019 - 8:21:19 AM
Last modification on : Tuesday, July 16, 2019 - 1:48:52 PM

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UNIV-TOURS | GREMAN | INSA-GROUPE

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Nathanaël Grillon, Emilien Bouyssou, Sebastien Jacques, Gaël Gautier. Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries. Microelectronics Reliability, Elsevier, 2019, 93, pp.102-108. ⟨10.1016/j.microrel.2019.01.003⟩. ⟨hal-01997427⟩

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