Nathanaël Grillon, Emilien Bouyssou, Sebastien Jacques, Gaël Gautier. Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries.
Microelectronics Reliability, Elsevier, 2019, 93, pp.102-108.
⟨10.1016/j.microrel.2019.01.003⟩.
⟨hal-01997427⟩