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Journal articles
Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries
Nathanaël Grillon 1
Author Employer institution : STMicroelectronics [Tours]
Emilien Bouyssou 1
Author
Sebastien Jacques 2
Author Employer institution : GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) IdHAL : sebastien-jacques IdRef : https://www.idref.fr/152552413 ORCID : https://orcid.org/0000-0002-6798-6914
Gaël Gautier 2
Author IdHAL : gael-gautier IdRef : https://www.idref.fr/069994293 ORCID : https://orcid.org/0000-0002-6854-7040
1
ST-TOURS - STMicroelectronics [Tours] (10 rue Thalès de Milet, 37071 Tours Cedex 2 - France)
2
GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) (Bât. E, 20 avenue Monge, 37200 Tours - France)
- Université de Tours (60 rue du Plat d'Étain, 37020 Tours cedex 1 - France)
- INSA CVL - Institut National des Sciences Appliquées - Centre Val de Loire (88 boulevard Lahitolle, CS 60013, 18022 Bourges cedex - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7347 (France)
Document type :
Journal articles
Complete list of metadatas
https://hal-univ-tours.archives-ouvertes.fr/hal-01997427
Contributor : Sebastien Jacques <>
Submitted on : Tuesday, January 29, 2019 - 8:21:19 AM
Last modification on : Tuesday, November 19, 2019 - 4:47:52 PM
Contributor : Sebastien Jacques <>
Submitted on : Tuesday, January 29, 2019 - 8:21:19 AM
Last modification on : Tuesday, November 19, 2019 - 4:47:52 PM
Identifiers
- HAL Id : hal-01997427, version 1
- DOI : 10.1016/j.microrel.2019.01.003
Collections
UNIV-TOURS | CNRS | GREMAN | INSA-GROUPE | INSA-CVL
Citation
Nathanaël Grillon, Emilien Bouyssou, Sebastien Jacques, Gaël Gautier. Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries. Microelectronics Reliability, Elsevier, 2019, 93, pp.102-108. ⟨10.1016/j.microrel.2019.01.003⟩. ⟨hal-01997427⟩
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