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Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

Nathanaël Grillon 1 Emilien Bouyssou 1 Sebastien Jacques 2 Gaël Gautier 2
1 ST-TOURS - STMicroelectronics [Tours]
2 GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies)
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Submitted on : Thursday, October 21, 2021 - 6:00:04 PM
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Nathanaël Grillon, Emilien Bouyssou, Sebastien Jacques, Gaël Gautier. Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries. Microelectronics Reliability, Elsevier, 2019, 93, pp.102-108. ⟨10.1016/j.microrel.2019.01.003⟩. ⟨hal-01997427⟩

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