Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

Nathanaël Grillon; Emilien Bouyssou; Sebastien Jacques; Gaël Gautier

doi:10.1016/j.microrel.2019.01.003

Journal articles

Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

Nathanaël Grillon ¹ Emilien Bouyssou ¹ Sebastien Jacques ² Gaël Gautier ²

1 ST-TOURS - STMicroelectronics [Tours]

2 GREMAN - UMR 7347 - GREMAN (matériaux, microélectronique, acoustique et nanotechnologies)

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Electronics

Engineering Sciences [physics] / Materials

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https://hal-univ-tours.archives-ouvertes.fr/hal-01997427
Contributor : Sebastien Jacques <>
Submitted on : Tuesday, January 29, 2019 - 8:21:19 AM
Last modification on : Tuesday, November 19, 2019 - 4:47:52 PM

Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

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Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries

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